Keithley 4200A-SCS Parameter Analyzer

Thương hiệu : Keithley

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Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

DC CURRENT-VOLTAGE
(I-V) RANGE
CAPACITANCE-VOLTAGE
(C-V) RANGE
PULSED I-V
RANGE
10 aA – 1A
0.2 µV – 210 V
1 kHz – 10 MHz
± 30V DC bias
±40 V (80 V p-p), ±800 mA
200 MSa/sec, 5 ns sampling rate

Parametric insight, fast and clear.

Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.

Highlights

  • Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
  • Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
  • Automated real-time parameter extraction, data graphing, analysis functions

Analysis function of semiconductor parameter analyzer

Accurate C-V Characterization

Measure single-digit femtofarads with Keithley’s newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley’s industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.

Highlights

  • First C-V meter in its class capable of driving a 1 V AC source voltage
  • 1 kHz frequency resolution from 1 kHz to 10 MHz
  • Measure capacitance, conductance, and admittance
  • Measure on up to four channels with the 4200A-CVIV Multiswitch
4200A SCS Front Femtofarad

Measure. Switch. Repeat.

The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.

Highlights

  • Move C-V measurement to any device terminal without re-cabling
  • User-configurable for low current capability
  • Personalize the names of output channels
  • View real-time test status

Integrated solution with analytical probers and cryogenic controllers

The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.

Highlights

  • “Point and click” test sequencing
  • “Manual” prober mode tests prober functionality
  • Fake prober mode enables debugging without removing commands

半導体パラメータアナライザは解析用プローバと温度コントローラをサポート

Model Description
4200A-SCS-PKA
High Resolution IV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
8101-PIV: One test fixture with sample devices
4200A-SCS-PKB
High Resolution IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4200-PA: One preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200A-SCS-PKC
High Power IV & CV
4200A-SCS: Parameter Analyzer mainframe
4201-SMU: Two medium power SMUs for high capacitance setups
4211-SMU: Two high power SMUs for high capacitance setups
4200-PA: Two preamplifier
4215-CVU: One high resolution multi-frequency C-V unit
8101-PIV: One test fixture with sample devices
4200-BTI-A
Ultra-fast NBTI/PBTI
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:

  • (1) 4225-PMU Ultra-Fast I-V Module
  • (2) 4225-RPM Remote Preamplifier/Switch Modules
  • Automated Characterization Suite (ACS) Software
  • Ultra-Fast BTI Test Project Module
  • Cabling