Motic Scientific’s PA80MET and PA120MET series microscopes feature a flexible, modular design that can be suited to your specific industrial inspection application. Our PA80MET and PA120MET series microscopes are widely used for FPD, LCD, and silicon wafer inspection.
| PA120MET Specification Details |
| Optical system | Colour Corrected Infinity Optical System (CCIS®) |
| Illumination | Reflected |
| Binocular Observation Tube (Optional) | Erect type (F.N 25), 20° inclined |
| Trinocular Observation Tube | Erect type (F.N 25), 20° inclined, Trino Light path selection: 2-step (100:0 / 0:100) |
| Eyepiece(s) | 10X (F.N 25), Diopter adjustable, Reticle optional |
| Revolving Nosepiece | 5-position Nosepiece for Brightfield objective lens with DIC slot |
| Base unit – Focus | Stroke range: 29.5 mm / Coarse and Fine focusing knob. Coarse: 17.7 mm/revolution / Fine: 0.1 mm/revolution (1μm scale) Upper limit stopper, Torque adjustment ring |
| Base unit – Electronics | Integrated power supply for light adjustment / LED voltage indicator / IL switch and ECO switch |
| Reflected Illumination | Kohler illumination system / Brightfield, Reflected DIC, simple Polarization |
| Light source | 12V/100W halogen |
| Objectives | |
| Plan S-APO | Plan S-APO 5X/0.15 Plan S-APO 10X/0.3 Plan S-APO 20X/0.45 Plan S-APO 50X/0.8 Plan S-APO 100X/0.9 (Optional) |
| LPlan S-APO | LPlan S-APO 20X/0.4 LPlan S-APO 50X/0.55 LPlan S-APO 100X/0.8 |
| Stage | |
| Size | 520 x 400mm |
| Moving stroke X&Y | 300 x 300mm |
| Optional Stage | wafer stage |
