Brand

Keithley

Sub Categories

Electric & Electronic Test and Measurements

Application

Source Measure Units

Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.

2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.

Features	Benefits
Active temperature control	Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems.
50W TEC Controller	Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions.
Fully digital P-I-D control	Provides greater temperature stability and can be easily upgraded with a simple firmware change.
Autotuning capability for the thermal control loop (2510-AT)	Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients.
Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C)	Covers most of the test requirements for production testing of cooled optical components and sub-assemblies.
Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors	Works with the types of temperature sensors most commonly used in a wide range of laser diode modules.
AC Ohms measurement function	Verifies the integrity of the TEC device.
4-wire open/short lead detection for thermal feedback element	Eliminates lead resistance errors on the measured value, reducing the possibility of false failures or device damage.

Model	Channels	Max Current Source/Measure Range	Max Voltage Source/Measure Range	Power	Measurement Resolution (Current / Voltage)
2510.	1	5A	10V	50 W	–
2510-AT	1	5A	10V	50 W	–
2520.	1	5A	10V	50 W	700nA / 0.33mV