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Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.
| DC CURRENT-VOLTAGE (I-V) RANGE |
CAPACITANCE-VOLTAGE (C-V) RANGE |
PULSED I-V RANGE |
| 10 aA – 1A 0.2 µV – 210 V |
1 kHz – 10 MHz ± 30V DC bias |
±40 V (80 V p-p), ±800 mA 200 MSa/sec, 5 ns sampling rate |
Parametric insight, fast and clear.
Advancing your bold discoveries has never been easier. The 4200A-SCS Parameter Analyzer reduces the time from setup to running characterization tests by up to 50%, allowing uncompromised measurement and analysis capability. Plus, embedded measurement expertise provides unparalleled test guidance and gives supreme confidence in the resulting measurements.
Highlights
- Advanced measurement hardware for DC I-V, C-V, and pulsed I-V measurement types
- Begin testing immediately with hundreds of user-modifiable application tests included in the Clarius software
- Automated real-time parameter extraction, data graphing, analysis functions
Accurate C-V Characterization
Measure single-digit femtofarads with Keithley’s newest capacitance-voltage unit (CVU), the 4215-CVU. By integrating a 1 V AC source into Keithley’s industry-leading CVU architecture, the 4215-CVU offers low-noise capacitance measurements at frequencies from 1 kHz to 10 MHz.
Highlights
- First C-V meter in its class capable of driving a 1 V AC source voltage
- 1 kHz frequency resolution from 1 kHz to 10 MHz
- Measure capacitance, conductance, and admittance
- Measure on up to four channels with the 4200A-CVIV Multiswitch
Measure. Switch. Repeat.
The 4200A-CVIV Multi-Switch automatically switches between I-V and C-V measurements without re-cabling or lifting the prober tips. Unlike competing products, the four-channel 4200A-CVIV display provides local visual insight for quick test setup and easy troubleshooting when unexpected results occur.
Highlights
- Move C-V measurement to any device terminal without re-cabling
- User-configurable for low current capability
- Personalize the names of output channels
- View real-time test status
Integrated solution with analytical probers and cryogenic controllers
The 4200A-SCS Parameter Analyzer supports many manual and semi-automated wafer probers and cryogenic temperature controllers, including MPI, Cascade MicroTech, Lucas Labs/Signatone, MicroManipulator, Wentworth Laboratories, LakeShore Model 336 cryogenic temperature controller.
Highlights
- “Point and click” test sequencing
- “Manual” prober mode tests prober functionality
- Fake prober mode enables debugging without removing commands
| Model | Description |
|---|---|
| 4200A-SCS-PKA High Resolution IV |
4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 8101-PIV: One test fixture with sample devices |
| 4200A-SCS-PKB High Resolution IV & CV |
4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4200-PA: One preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
| 4200A-SCS-PKC High Power IV & CV |
4200A-SCS: Parameter Analyzer mainframe 4201-SMU: Two medium power SMUs for high capacitance setups 4211-SMU: Two high power SMUs for high capacitance setups 4200-PA: Two preamplifier 4215-CVU: One high resolution multi-frequency C-V unit 8101-PIV: One test fixture with sample devices |
| 4200-BTI-A Ultra-fast NBTI/PBTI |
For sophisticated NBTI and PBTI measurements on leading-edge silicon CMOS technology Package 4200-BTI-A includes:
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