Keithley Ultra-Low Resistance Configurations Series 6200/2182A

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Keithley Ultra-Low Resistance Configurations Series 6200/2182A

Name: Keithley Ultra-Low Resistance Configurations Series 6200/2182A
Brand: Keithley
Rating: 4.9 (50 reviews)

Thương hiệu : Keithley

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When connected, the Model 2182A and Model 6220 or 6221 can be operated like a single instrument. The 2182A/622X combination is ideal for resistance measurements, pulsed I-V measurements, and differential conductance measurements, providing significant advantages over other solutions. The 2182A/622X combination is also well suited for many nanotechnology applications because it can measure resistance without dissipating much power in the device under test (DUT), which would otherwise invalidate results or even destroy the DUT.

Features	Benefits
Measure resistances from 10nΩ to 100MΩ	Covers an extremely wide measurement range and specializes in ultra-low resistance measurements for characterizing high conductivity materials, nanomaterials, and superconducting materials.
Synchronized current-pulsed source and measurement times as short as 50µs	Limits power dissipation in components such as nanodevices and nanomaterials that can be easily destroyed unless tested at very low power levels.
Delta mode current reversal, resistance measurement technique	Makes accurate ultra-low resistance measurements by eliminating the effects of thermal offsets and reduces noise down to 30nV p-p noise (typical) for one reading. Multiple readings can be averaged for greater noise reduction.
Differential conductance measurement	Offers speeds ten times faster and lower noise than other conductance measurement techniques. Good measurements are made without the need to average the results of multiple sweeps.
Nanovoltmeter and current source interface to work together seamlessly	Both instruments can be operated like a single instrument when making differential conductance and resistance measurements.
Delta, differential conductance, and pulse modes generate minimal current transients	Allows characterizing devices that can be easily disrupted by current spikes.